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Testing, Reliability, and Application of Micro- and Nano- Material Systems (Proceedings of SPIE)

Meyendorf, Norbert/ Baakini, George Y./ Michel, Bernd
176.25 AUD
会員価格
158.63
English
Publisher
SPIE Press
Publication Date
Jan 2003
ISBN
9780819448507
Pages
276 p.
Item Type
Book
Format
Paperback

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