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Scanning Electron Microscopy and X-Ray Microanalysis (3RD)

Goldstein, Joseph/ Newbury, Dale E./ Joy, David C./ Lyman, Charles E./
234.98 AUD
Member Price
211.49
English

Product Description

In the decade since the publication of the second edition of Scanning Electron Microscopy and X-Ray Microanalysis, there has been a great expansion in the capabilities of the basic scanning electron microscope (SEM) and the x-ray spectrometers.

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